smartctl 7.3 2022-02-28 r5338 [OpenBSD 7.3 amd64] (local build)
Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org

=== START OF INFORMATION SECTION ===
Model Family:     Silicon Motion based SSDs
Device Model:     ADATA SP550
Serial Number:    --
Firmware Version: O0730A
User Capacity:    240,057,409,536 bytes [240 GB]
Sector Size:      512 bytes logical/physical
Rotation Rate:    Solid State Device
TRIM Command:     Available, deterministic, zeroed
Device is:        In smartctl database 7.3/5319
ATA Version is:   ACS-2 (minor revision not indicated)
SATA Version is:  SATA 3.1, 6.0 Gb/s (current: 3.0 Gb/s)
Local Time is:    Sat May 13 16:14:02 2023 EEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART Status not supported: Incomplete response, ATA output registers missing
SMART overall-health self-assessment test result: PASSED
Warning: This result is based on an Attribute check.

General SMART Values:
Offline data collection status:  (0xe8)	Offline data collection activity
					is in a Vendor Specific state.
					Auto Offline Data Collection: Enabled.
Self-test execution status:      (   0)	The previous self-test routine completed
					without error or no self-test has ever 
					been run.
Total time to complete Offline 
data collection: 		(25600) seconds.
Offline data collection
capabilities: 			 (0x71) SMART execute Offline immediate.
					No Auto Offline data collection support.
					Suspend Offline collection upon new
					command.
					No Offline surface scan supported.
					Self-test supported.
					Conveyance Self-test supported.
					Selective Self-test supported.
SMART capabilities:            (0x0002)	Does not save SMART data before
					entering power-saving mode.
					Supports SMART auto save timer.
Error logging capability:        (0x01)	Error logging supported.
					General Purpose Logging supported.
Short self-test routine 
recommended polling time: 	 (   1) minutes.
Extended self-test routine
recommended polling time: 	 (   2) minutes.
Conveyance self-test routine
recommended polling time: 	 (   1) minutes.
SCT capabilities: 	       (0x0035)	SCT Status supported.
					SCT Feature Control supported.
					SCT Data Table supported.

SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME          FLAG     VALUE WORST THRESH TYPE      UPDATED  WHEN_FAILED RAW_VALUE
  1 Raw_Read_Error_Rate     0x0000   100   100   000    Old_age   Offline      -       0
  5 Reallocated_Sector_Ct   0x0000   100   100   000    Old_age   Offline      -       12
  9 Power_On_Hours          0x0000   100   100   000    Old_age   Offline      -       2069
 12 Power_Cycle_Count       0x0000   100   100   000    Old_age   Offline      -       15292
160 Uncorrectable_Error_Cnt 0x0000   100   100   000    Old_age   Offline      -       237
161 Valid_Spare_Block_Cnt   0x0000   100   100   000    Old_age   Offline      -       198
163 Initial_Bad_Block_Count 0x0000   100   100   000    Old_age   Offline      -       22
148 Total_SLC_Erase_Ct      0x0000   100   100   000    Old_age   Offline      -       1103293
149 Max_SLC_Erase_Ct        0x0000   100   100   000    Old_age   Offline      -       10631
150 Min_SLC_Erase_Ct        0x0000   100   100   000    Old_age   Offline      -       10443
151 Average_SLC_Erase_Ct    0x0000   100   100   000    Old_age   Offline      -       10608
164 Total_Erase_Count       0x0000   100   100   000    Old_age   Offline      -       217208
165 Max_Erase_Count         0x0000   100   100   000    Old_age   Offline      -       155
166 Min_Erase_Count         0x0000   100   100   000    Old_age   Offline      -       53
167 Average_Erase_Count     0x0000   100   100   000    Old_age   Offline      -       110
168 Max_Erase_Count_of_Spec 0x0000   100   100   000    Old_age   Offline      -       1000
169 Remaining_Lifetime_Perc 0x0000   000   000   000    Old_age   Offline      -       0
175 Program_Fail_Count_Chip 0x0000   100   100   000    Old_age   Offline      -       0
176 Erase_Fail_Count_Chip   0x0000   100   100   000    Old_age   Offline      -       0
177 Wear_Leveling_Count     0x0000   100   100   050    Old_age   Offline      -       435
178 Runtime_Invalid_Blk_Cnt 0x0000   100   100   000    Old_age   Offline      -       0
181 Program_Fail_Cnt_Total  0x0000   100   100   000    Old_age   Offline      -       0
182 Erase_Fail_Count_Total  0x0000   100   100   000    Old_age   Offline      -       0
192 Power-Off_Retract_Count 0x0000   100   100   000    Old_age   Offline      -       554
194 Temperature_Celsius     0x0000   100   100   000    Old_age   Offline      -       36
195 Hardware_ECC_Recovered  0x0000   100   100   000    Old_age   Offline      -       0
196 Reallocated_Event_Count 0x0000   100   100   016    Old_age   Offline      -       63
197 Current_Pending_Sector  0x0000   100   100   000    Old_age   Offline      -       0
198 Offline_Uncorrectable   0x0000   100   100   000    Old_age   Offline      -       63
199 UDMA_CRC_Error_Count    0x0000   100   100   050    Old_age   Offline      -       42330

SMART Error Log Version: 1
Warning: ATA error count 0 inconsistent with error log pointer 3

ATA Error Count: 0
	CR = Command Register [HEX]
	FR = Features Register [HEX]
	SC = Sector Count Register [HEX]
	SN = Sector Number Register [HEX]
	CL = Cylinder Low Register [HEX]
	CH = Cylinder High Register [HEX]
	DH = Device/Head Register [HEX]
	DC = Device Command Register [HEX]
	ER = Error register [HEX]
	ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.

Error -2 occurred at disk power-on lifetime: 0 hours (0 days + 0 hours)
  When the command that caused the error occurred, the device was in an unknown state.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  00 ec 00 00 00 00 00  Device Fault

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  c8 00 00 00 00 00 00 00      00:00:00.000  READ DMA

Warning! SMART Self-Test Log Structure error: invalid SMART checksum.
SMART Self-test log structure revision number 1
Num  Test_Description    Status                  Remaining  LifeTime(hours)  LBA_of_first_error
# 1  Offline             Completed without error       00%        21         -

SMART Selective self-test log data structure revision number 1
 SPAN  MIN_LBA  MAX_LBA  CURRENT_TEST_STATUS
    1        0        0  Not_testing
    2        0        0  Not_testing
    3        0        0  Not_testing
    4        0        0  Not_testing
    5        0        0  Not_testing
    6        0    65535  Read_scanning is in a Vendor Specific state
Selective self-test flags (0x0):
  After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.

